DeFelsko RTR3D1-G Positector RTR 3D1 Standard Replica Tape Reader to Measure and Record 2D/3D Surface Profile Parameters
The DeFelsko RTR3D1-G Positector RTR 3D1 Standard Replica Tape Reader to Measure and Record 2D/3D Surface Profile Parameters is a hand-held electronic instrument that measures burnished Testex Press-O- FilmTM replica tape and uses a light intensity versus thickness algorithm to produce three-dimensional (3D) images of the replicated surface. Images generated within the gage are analyzed to produce 2D and 3D parameters that represent specific characteristics of a surface.
Create a replica by burnishing tape on a surface and insert into instrument. 3D imagery and 2D/3D parameters are displayed in seconds! Reports common parameters: Ra, Rq, Rz, Rp, Rv, Rt, Rpc (2D), and Sa, Sq, Sz, Sp, Sv, and Spd (3D) Ideal for field or laboratory use; flat, curved or irregular surfaces Certified and traceable to an accredited national laboratory Download 3D .SDF image files for analysis in included PosiSoft or third party software Certificate of Calibration showing traceability to PTB (for H and HL only) and NPL (for Ra and Rt) included (Long Form) Conforms to ASME B46, ASTM D4417, ISO 8503-5, NACE SP287, SSPC-PA 17, SSPC-SP5, SP6, SP10, SP11-87T and others
Manufacturer
DeFelsko
Warranty
Two Years
Measuring Range (H)
20 - 115 µm 0.8 - 4.5 mils
Measuring Range (Rt)
10 - 115 µm 0.4 - 4.5 mils
Measuring Roughness (Ra)
2 µm 0.08 mils
Accuracy (H)
± 5 µm ± 0.2 mil
Accuracy (Rt)*
± (5 µm + 5%) ± (0.2 mil + 5%)
Accuracy (Ra)*
± (0.25 µm + 5%) ± (0.01 mil + 5%)
Anvil Pressure
1.1 Newtons 110 grams-force
Field of View
3.8 x 3.8 mm 0.149 x 0.149 inch
Lateral Sampling
3.7 µm 0.145 mil
Vertical Resolution
100 nm - 2D/3D | 10 nm - SDF 3.93 µin - 2D/3D | 0.393 µin - SDF
Resolution
0.01 µm 0.01 mil
* When measured using Optical Grade X-Coarse Replica Tape
* When measured using Optical Grade X-Coarse Replica Tape
More Information
Product Specifications
Manufacturer
DeFelsko
Warranty
Two Years
Measuring Range (H)
20 - 115 µm 0.8 - 4.5 mils
Measuring Range (Rt)
10 - 115 µm 0.4 - 4.5 mils
Measuring Roughness (Ra)
2 µm 0.08 mils
Accuracy (H)
± 5 µm ± 0.2 mil
Accuracy (Rt)*
± (5 µm + 5%) ± (0.2 mil + 5%)
Accuracy (Ra)*
± (0.25 µm + 5%) ± (0.01 mil + 5%)
Anvil Pressure
1.1 Newtons 110 grams-force
Field of View
3.8 x 3.8 mm 0.149 x 0.149 inch
Lateral Sampling
3.7 µm 0.145 mil
Vertical Resolution
100 nm - 2D/3D | 10 nm - SDF 3.93 µin - 2D/3D | 0.393 µin - SDF
Resolution
0.01 µm 0.01 mil
* When measured using Optical Grade X-Coarse Replica Tape
* When measured using Optical Grade X-Coarse Replica Tape
Product Features
Create a replica by burnishing tape on a surface and insert into instrument. 3D imagery and 2D/3D parameters are displayed in seconds! Reports common parameters: Ra, Rq, Rz, Rp, Rv, Rt, Rpc (2D), and Sa, Sq, Sz, Sp, Sv, and Spd (3D) Ideal for field or laboratory use; flat, curved or irregular surfaces Certified and traceable to an accredited national laboratory Download 3D .SDF image files for analysis in included PosiSoft or third party software Certificate of Calibration showing traceability to PTB (for H and HL only) and NPL (for Ra and Rt) included (Long Form) Conforms to ASME B46, ASTM D4417, ISO 8503-5, NACE SP287, SSPC-PA 17, SSPC-SP5, SP6, SP10, SP11-87T and others
Downloads
