The Testex TX-LG Linearizing Spring Micrometer Dial Gauge, Inch Units is used in conjunction with a Testex replica tape for acquiring surface profile measurements according to Method C in ASTM D4417. The replica tape is rubbed onto the abrasive blast cleaned surface forming a reverse replica of the peak-valley pattern in the steel.
To be used with Testex replica Press-O-Film Tape to measure the surface roughness of blast cleaned surfaces
A unique replica technique and a simple snap gauge make possible accurate, low-cost blast surface profile measurements
Testex Micrometer Dial Thickness Gage is used in conjunction with a Testex replica tape for acquiring surface profile measurements according to Method C in ASTM D4417. The replica tape is rubbed onto the abrasive blast cleaned surface forming a reverse replica of the peak-valley pattern in the steel.
The replica is quantified using a spring loaded micrometer to determine the maximum peak-to-valley depth.
Kit Contents: Testex Micrometer Dial Thickness Gage Inch Units, plastic burnishing tool, instructions and carrying case. Certificate of Calibration Not Included
To be used with Testex replica Press-O-Film Tape to measure the surface roughness of blast cleaned surfaces
A unique replica technique and a simple snap gauge make possible accurate, low-cost blast surface profile measurements
Testex Micrometer Dial Thickness Gage is used in conjunction with a Testex replica tape for acquiring surface profile measurements according to Method C in ASTM D4417. The replica tape is rubbed onto the abrasive blast cleaned surface forming a reverse replica of the peak-valley pattern in the steel.
The replica is quantified using a spring loaded micrometer to determine the maximum peak-to-valley depth.
Kit Contents: Testex Micrometer Dial Thickness Gage Inch Units, plastic burnishing tool, instructions and carrying case. Certificate of Calibration Not Included
